Dynamic Background Correction of Electron Backscatter Diffraction Patterns
نویسندگان
چکیده
منابع مشابه
Direct detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
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We present an approach for the simulation of complete electron backscatter diffraction (EBSD) patterns where the relative intensity distributions in the patterns are accurately reproduced. The Bloch wave theory is applied to describe the electron diffraction process. For the simulation of experimental patterns with a large field of view, a large number of reflecting planes has to be taken into ...
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The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملDigital direct electron imaging of energy-filtered electron backscatter diffraction patterns
S. Vespucci,1 A. Winkelmann,2 G. Naresh-Kumar,1 K. P. Mingard,3 D. Maneuski,4 P. R. Edwards,1 A. P. Day,5 V. O’Shea,4 and C. Trager-Cowan1,* 1Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, United Kingdom 2Bruker-Nano, Am Studio 2D, 12489 Berlin, Germany 3National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom 4School of Physics and Astronomy, SUPA, ...
متن کاملElectron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605506676